SNAP 100
SNAP 200
SNAP 300
SNAP 350
제품특징 • 양전자 중심 광학 장치를 통해 작업장 조건에서 정확한 부품 측정 가능 • AutoID는 시야에서 알려진 부분을 인식합니다. • 시야에서 알 수 없는 부분을 자동으로 찾아 측정 • 독점 줌 Anywhere™ 기술을 통해 보기 영역 어디에서나 세부 정보를 측정할 수 있습니다. • SNAP 100을 사용하면 부품 방향에 관계없이 고정 없이 빠르게 측정 가능 |
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Specifications
| Standard | Optional | ||
Measuring unit | Rigid, cast aluminum base and nickel plated worktable; 4 kg load capacity, evenly distributed | |||
Stage | Manual 75 mm Z axis (focus) adjustment with lock | Motorized, programmable 75 mm Z axis (focus) adjustment SNAP Miniature Rotary (SMR) indexer | ||
Optics | Bi-telecentric, single optical magnification | Bi-telecentric, dual optical magnification with 4X high magnification lens | ||
Illumination | Monochromatic LED substage profile light, and programmable 8 sector monochromatic ring light | LED monochromatic coaxial through-the-lens surface light | ||
Metrology camera | QVI High Density Megapixel Metrology Camera | QVI Large Field Megapixel Metrology Camera | ||
Maximum field of view (diagonal) | Single Mag / High Density Camera: 78 mm | Single Mag / Large Field Camera: 100 mm | ||
Depth of field | Single Mag / High Density Camera: 20 mm | Single Mag / Large Field Camera: 50 mm | ||
Image processing | SNAP advanced image analysis, 256 level grayscale, with 10:1 - 50:1 sub-pixel resolution | |||
Controls | GO button, illumination & magnification controls | Controls for motorized Z motion control | ||
System controller without notice | SNAP system controller with networking and communication ports | Single flat panel LCD monitor, or dual flat panel LCD monitors; keyboard, mouse | ||
Miscellaneous options |
| Barcode reader, USB digital I/O capability, USB - Ethernet adapter, dust cover, fixture kit, peripheral support frame, calibration artifact | ||
Rated environmen | Temperature 18 °C - 22 °C, stable to ±1 °C; 30-80% humidity; vibration <0.001g below 15 Hz | |||
Power | 100-120 VAC or 200-240 VAC 50/60 Hz 1 phase 160 W |
Software
SNAP-X